Dual-Band Probe
Integrated dual-band design supports multi-band combined measurements, reducing probe changes and improving test efficiency.
- Frequency RangeDC-170 GHz / DC-220 GHz
- Interface TypeWR-6 waveguide + 1.0mm coaxial / WR-5 waveguide + 0.8mm/1.0mm coaxial
Product Overview
Our dual-band probe integrates both waveguide and coaxial interfaces into a single unit, covering two frequency bands in one contact and significantly reducing probe changes to improve test efficiency. Manufactured with precision processing and premium dielectric materials, it ensures perfect matching between the probe and interface across each band, ideal for on-wafer RF/microwave testing, optoelectronic device characterization, and high-speed interconnect signal integrity verification.
Key Features
Dual-Band
Covers DC–110 GHz and 110–170 GHz in one contact, eliminating the need to change probes.
Low Insertion Loss
Premium dielectric materials keep insertion loss below 5 dB.
High Repeatability
Contact design ensures consistent results across measurements, with repeatability better than 0.05 dB.
Durable Design
Stainless steel housing with replaceable probe tips for a long service life.
Fast Repair Cycle
Quick repair response with local maintenance within one week.
Customization
Frequency ranges and interface configurations can be customized to customer requirements.
More Information
| Frequency/GHz | DC-170 | DC-220 |
|---|---|---|
| Tip Type | GSG | GSG |
| Recommended Tip Pitch/µm | 75-125 | 75-125 |
| New Tip Pitch/µm | 100 | Customized on request |
| Connector Type | WR-6 waveguide + 1.0mm coaxial | WR-5 waveguide + 1.0/0.8mm coaxial |
For more information, please download:
Datasheet
Detailed electrical specifications, mechanical dimensions and interface definitions.
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