Product Center

We provide high-performance RF and microwave test and measurement solutions, including probes, probe stations and calibration substrates.

Probes

  • Single Waveguide Probe

    Single Waveguide Probe

    Covers 70 GHz to 500 GHz with low insertion loss, ideal for millimeter-wave testing.

    Learn More
  • Difference Waveguide Probe

    Difference Waveguide Probe

    Covers 70 GHz to 500 GHz with low insertion loss, ideal for millimeter-wave differential testing.

    Learn More
  • Single Coaxial Probe

    Single Coaxial Probe

    Ultra-broadband coaxial probe with high repeatability, ideal for chip-level testing.

    Learn More
  • Difference Coaxial Probe

    Difference Coaxial Probe

    Ultra-broadband differential coaxial probe with high repeatability, ideal for chip-level differential testing.

    Learn More
  • Dual-band Probes

    Dual-band Probes

    Integrated dual-band design supports multi-band combined measurements, reducing probe changes and improving test efficiency.

    Learn More

Probe System

  • Manual Probe Station

    Manual Probe Station

    Accommodates samples of various sizes, such as 8-inch and 12-inch wafers, and supports different applications, from DC to RF testing.

    Learn More
  • Semi-Automatic Probe Station

    Semi-Automatic Probe Station

    Supports automatic wafer loading and precise alignment for 8-inch and 12-inch wafers, ideal for high-volume on-wafer DC and RF testing.

    Learn More

Impedance Standard Substrates

  • Impedance Standard Substrate

    Impedance Standard Substrate

    High-precision impedance standard substrates for calibrating probes and test systems.

    Learn More
Contact Us